Precession Electron Diffraction Scanning in Transmission Electron Microscopes
There is growing interest in using nanobeam diffraction mapping techniques to characterize the structure of materials at the nanoscale. With this technique, a series of diffraction patterns are collected in a transmission electron microscope and stored while the focused beam scans the sample. Diffraction scanning techniques benefit from precession electron diffraction (PED). This is because precession is known to increase the number of reflections and to decrease the dynamic effect on the Bragg reflection intensities, which, in turn, improves the quality of the diffraction patterns.
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Date & Location
July 16, 2019
BME Conference Room - Technological Institute E311
11:00 AM - 12:30 PM : Talk
2:00 PM - 3:00 PM :  Round Table Discussion

(Both the talk and discussion will be held in Cook Hall Room #2058)
Robert Stroud, NanoMEGAS USA
As Sales Director for NanoMEGAS USA, Robert has responsibility for sales and service within North and South America. Previous sales and marketing positions, over the past 24 years, have included US Country Manager for Cameca Instruments, and Asia Pacific Sales Manager for FEI Company.

He holds a Master’s Degree in Material Science, from Boise State University, and Bachelor’s of Science in Mechanical Engineering, from the University of Idaho. Prior to working in the field of electron microscopy and metrology, he spent 15 years as a licensed professional engineer in Oregon.
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