JavaScript isn't enabled in your browser, so this file can't be opened. Enable and reload.
TEM measurement request
please fill in the form below
Sign in to Google
to save your progress.
Learn more
* Indicates required question
Email
*
Your email
Name
*
Your answer
Surname
*
Your answer
Phone number
*
Your answer
Date
*
MM
/
DD
/
YYYY
Please select one option
*
University
Research Centre
Company
Other:
Name of the Institution
*
Your answer
Department or Unit
*
Your answer
Name of the sample(s)
*
Your answer
Chemical Composition
*
Your answer
Please specify the voltage to be used (based on the sensitivity of your sample to the beam)
*
80 kV
200 kV
Required
Please mark which techniques have been used to pre-characterize the specimen
*
SEM
AFM
X-ray diffraction
Other:
Required
TEM sample preparation:
please specify the solvent to be used for making a dispersion in case you want your sample to be drop-casted onto a TEM grid.
Solvent:
*
Not required
Ethanol
Acetone
Water
Other:
additional information:
(e.g. sensitivity to the beam, particle size, etc.)
Your answer
What is the main goal of using JEM-F200: (please describe the specific problem and mark which operation mode you would like to be used)
*
Your answer
operation mode (you can select as many as you need)
*
TEM, HR-TEM
STEM
SAED
EDX
Required
Send me a copy of my responses.
Submit
Clear form
Never submit passwords through Google Forms.
reCAPTCHA
Privacy
Terms
This form was created inside of Università Ca’ Foscari.
Report Abuse
Forms
