The Dawn or Dusk of "Transistor Reliability" Physics?

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Transistors are being scaled to sub-5 nm node. What would be the dominant degradation mode(s) for these FinFET and GAA Nanosheet/ ribbon-FET transistors?

On-state HCI

Off-state HCI

NBTI

PBTI

TDDB/SILC from gate stack

TDDB/SILC from gate-to-contact

Radiation/Soft Errors

None of the above

Which is a bigger concern in terms of product reliability?

Logic transistors are always more difficult to qualify compared to memory transistors (e.g. DRAM/Flash)

Logic reliability issues are somewhat more standardized compared to memory qualification

They have very different degradation modes and therefore cannot be compared

Cannot compare because I do not work on both technologies

Clear selection

What is the role of self-heating in defining the reliability of modern transistors?

Critically important

Somewhat important

Important, but not a critical issue

Not important for our technology

Clear selection

What is the role of device and circuits reliability (simulation) tools in ensuring the reliability of circuits and systems?

Critically important and are widely used

Critically important, but are not as widely used

Somewhat important, are used once there is a reliability issue

Reliability modeling appears important in theory, but does not play an important role in practice

Clear selection

There has been a lot of discussion regarding application-aware qualification. Application-specific information is

Critically important in ensuring product reliability

Is somewhat important, but not essential for product qualification.

Are often unavailable or have poor data quality, therefore not very useful

Are seldom accounted for during technology development

Clear selection

Cryo electronics is being discussed as a potential new application space for CMOS transistors. Compared to room-temperature electronics,

Cryo electronics would be significantly more reliable

Cryo electronics would be significantly less reliable

Reliability challenges would be fundamentally different

Reliability issues will remain essentially the same

Significantly less

Clear selection

Hardware-based neural networks and Machine learning algorithms use transistors in a different way compared to CMOS logic. Do you feel these technologies will be

Much more reliable compared to CMOS transistors

Reliability mechanisms would essentially be the same

Reliability issues would be somewhat different, but they can be understood using CMOS physics

Reliability issues would be fundamentally different

Clear selection

How important is it to correlate frontend (FEOL) and backend (BEOL) reliability ?

Critically important for essentially all applications

Critically important for some applications

Somewhat important

Not important all, based on your experience

Clear selection

Regarding radiation-damage, would the future generation transistors would be

Much more radiation tolerant

Somewhat more radiation tolerant

Radiation tolerance would remain the same

Radiation tolerance would improve significantly

Clear selection

In hiring reliability engineers for front-end transistor reliability, what is the most important qualification do you look for?

Basic knowledge about device physics

General knowledge regarding reliability physics

A broad understanding of statistics

A familiarity with characterization equipment

Additional expertise

Clear selection

In which of the following areas you would expect academia to put more efforts on (select your top-3)

Advanced characterization techniques for FEOL transistor’s reliability

Advanced characterization techniques for BEOL interconnect’ s reliability

TCAD modeling for reliability physics (atomistic)

TCAD modeling for reliability physics (device-level)

TCAD/Compact modeling for reliability physics (circuit-level)

Emerging reliability physics in cryogenic-electronics

Emerging reliability physics in non-volatile memories (RRAM, PcRAM, Selector, MRAM, FeRAM)

Emerging reliability physics in 3D-IC technologies (TSV, buried power rail, SuperVia)

None of the above (please help specify)

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